Improvement of the Probe Card Test Environment
碩士 === 義守大學 === 電子工程學系碩士班 === 97 === After wafer fabrication, the next process is wafer testing. For wafer testing, the probe card is very important. It is the interface among the prober, tester and load board. The price of the probe cards are expensive and from several hundred thousands to millions...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/70043045667217454005 |