Monitoring IC-Marking Defects Using Demerit Control Chart
碩士 === 國立高雄應用科技大學 === 工業工程與管理系 === 97 === The production of dynamic random access memory (DRAM) has become one of the key fields in Taiwan’s semiconductor industry. The production chain for a DRAM includes IC design, wafer manufacturing, IC assembly and testing, module house, and supply channel. Amo...
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| Format: | Others |
| Language: | en_US |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/60260320271596197786 |