Effect of crack under temperature cycle test for drop in heat slug quad flat package(QFP)

碩士 === 國立高雄應用科技大學 === 化學工程與材料工程系 === 97 === Considering process and cost, the heat slug do not attach on die pad backside of drop-in heat slug quad flat package (QFP).But it will affect crack phenomenon between heat slug and die pad during temperature cycle test (TCT) due to the coefficient of therm...

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Bibliographic Details
Main Authors: Hsin-Hao Chen, 陳星豪
Other Authors: Dr.Tsung-Han Ho
Format: Others
Language:zh-TW
Published: 2009
Online Access:http://ndltd.ncl.edu.tw/handle/02428542308453487755