The study of electro-static discharge protection for wafer mount machine
碩士 === 國立高雄應用科技大學 === 電機工程系 === 97 === The purpose of this thesis is preventing wafer electrostatic puncturing from wafer mount machine. Failed die were found after electronic testing and the production yield was around 93.58%. Because those problems almost take place on wafer mounting machine, and...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/95111210465380620925 |