Design and Development of an Automated Visual Inspection System for Die Surface Defects
碩士 === 國立交通大學 === 工業工程與管理系所 === 97 === Product quality is an important factor in semiconductor manufacturing. Therefore, die defect inspection is an important quality control process before packaging. Conventionally, the inspection of die surface defects by human observation is labor intensive. It r...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2009
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/73552165301373767638 |