High Speed Serial Link Built-in Self Test Circuit Design

碩士 === 國立交通大學 === 電機學院IC設計產業專班 === 97 === In this thesis, we propose a high speed serial link built-in self test circuit design for low-cost mass production. It includes a Digital Control Delay Line (DCDL) for clock delay adjustment, a Sample and Hold (S/H) module for capture the signal, a Digital-t...

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Bibliographic Details
Main Authors: JuMin Shih, 史汝敏
Other Authors: ChauChin Su
Format: Others
Language:zh-TW
Published: 2008
Online Access:http://ndltd.ncl.edu.tw/handle/88015773626557105416