Applying Association Rule Mining to a Probe Card Management System
碩士 === 國立交通大學 === 管理學院碩士在職專班資訊管理組 === 97 === In the semiconductor industry, the wafer probe card, a mechanical and electrical bridge to connect the wafer with tester, is necessary in a wafer probing process to evaluate the function, reliability and performance for a chip. The wafer probe card contai...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/30022446381844538829 |