Multiple-Fault Silicon Diagnosis Using Faulty Region Identification
碩士 === 國立交通大學 === 電子工程系所 === 97 === While designs are getting complex and technology becomes advanced, some errors may escape the verification flows pre-silicon, but exhibit on silicon. Because of physical limitation of chips, it is difficult to access data in chips. If errors occur, silicon diagnos...
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| Format: | Others |
| Language: | en_US |
| Published: |
2008
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| Online Access: | http://ndltd.ncl.edu.tw/handle/30384184735917047574 |