Efficient Yield and Reliability Enhancement Techniques for Random Access Memories
碩士 === 國立中央大學 === 電機工程研究所 === 97 === Yield and reliability are two key challenges for designing nano-scale chips. Embedded memory is one key component in modern system-on-chip (SoC) designs. It typically represents a significant portion of the chip area as well. Moreover, it is designed with the sma...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2009
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/26827284844866902668 |