Reliability Assessment of High Voltage Multilayer Ceramic Capacitors Using Highly Step-Stress Accelerated Life Testing

碩士 === 國立彰化師範大學 === 機電工程學系 === 97 === We present the reliability assessment on high voltage rated, surface mount multilayer ceramic capacitors (HV-MLCCs) using highly step-stress accelerated life testing which allows us rapidly estimate the reliability of devices, rather than the long test duration...

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Bibliographic Details
Main Authors: Yu-Jen Chuang, 莊毓仁
Other Authors: Kuan-Jung Chung
Format: Others
Language:zh-TW
Published: 2009
Online Access:http://ndltd.ncl.edu.tw/handle/09413675879423928200