Reliability Assessment of High Voltage Multilayer Ceramic Capacitors Using Highly Step-Stress Accelerated Life Testing
碩士 === 國立彰化師範大學 === 機電工程學系 === 97 === We present the reliability assessment on high voltage rated, surface mount multilayer ceramic capacitors (HV-MLCCs) using highly step-stress accelerated life testing which allows us rapidly estimate the reliability of devices, rather than the long test duration...
Main Authors: | Yu-Jen Chuang, 莊毓仁 |
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Other Authors: | Kuan-Jung Chung |
Format: | Others |
Language: | zh-TW |
Published: |
2009
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Online Access: | http://ndltd.ncl.edu.tw/handle/09413675879423928200 |
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