High Reliability Built-in Self Detection/Recovery Architecture Design for SRAM
碩士 === 國立東華大學 === 電機工程學系 === 97 === The rapid development of the process technology of chips leads to the decrease in chips size and the increase in chips density. Portable electronic devices such as laptops, mobile phones, and PDA (Personal Digit Assistant) are now lighter to carry, which meet cons...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2009
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/77876781263365048298 |