The Effects of Temperature and DC Bias on the RF Performances of On-chip Spiral Inductors in the Automatic Test System

碩士 === 國立高雄第一科技大學 === 電腦與通訊工程所 === 97 === This dissertation discusses the performance of RF Spiral Inductors under different temperature and DC bias in the Automatic Test System. First, we use automatic RF measurement system to measure the effect of the quality factor (Q), with different line width...

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Bibliographic Details
Main Authors: Te-Jen Chang, 張德仁
Other Authors: Miin-Jong Hao
Format: Others
Language:en_US
Published: 2009
Online Access:http://ndltd.ncl.edu.tw/handle/35844704576216648308