Utilizing AFM for Surface Force Measurement and Structure Characterization
碩士 === 國立中山大學 === 化學系研究所 === 97 === Atomic force microscopy (AFM) is an important technology that allows researchers to probe local surface properties at nanometer length scales. In addition to surface topography, the AFM can probe many types of tip-surface interactions (including adhesion and frict...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/p39evt |