Observation of Co、Ni and Co、Ni compound Nano-particles by Scanning Probe Microscopy
碩士 === 國立臺灣師範大學 === 物理學系 === 97 === Abstract This experimental purpose is to utilize an atomic force microscopy(AFM) and magnetic force microscopy(MFM) to survey the morphology and magnetic phenomenon of cobalt、nickel and cobalt with nickel compound nanoparticles.The cobalt、nickel and cobalt wit...
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| Format: | Others |
| Language: | zh-TW |
| Online Access: | http://ndltd.ncl.edu.tw/handle/34314895346261807058 |