Development of an Image Inspection System for OLED Surface Defects
碩士 === 國立臺灣科技大學 === 高分子系 === 97 === At present, the OLED (Organic Light Emitting Diode) manufacturing industry has not a way of quite accurate OLED surface detection yet. The way of inspect is still by the man-power or by the chromometer primarily. This kind of detection consumes lots of man-power,...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/63294077016863014438 |