Atomic Force Microscopy Scanning Measurement effect with different rectangular cantilever probe Sizes and External Vibration
碩士 === 國立臺灣科技大學 === 機械工程系 === 97 === Abstract The study mainly investigates the different measurement errors caused to Contact Mode Atomic Force Microscopy (CM-AFM) when using probe tips with different cantilever shapes and dimensions, and also looks into the different measurement errors caused to T...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/95394757639449634387 |