Study on Angle deviation microscopy for NA=0.65
碩士 === 國立虎尾科技大學 === 光電與材料科技研究所 === 97 === A new microscopy technique that we transmission angle deviation microscopy (TADM) is presented. It is based on common-path heterodyne interference and the surface plasmon resonance (SPR) sensor with using the microscope which NA value is 0.65. The method can...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/5ey5qg |