Study on the Surface Profile Measurement by Uses of the Critical Angle Method and a CCD Camera.
碩士 === 國立虎尾科技大學 === 光電與材料科技研究所 === 97 === In this paper, we proposed a new method based on the critical angle method and the use of a CCD camera for surface profile measurement of a transparent component, a broaden beam was normally incident at a transparent test component, and the output beam was i...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/v43376 |