Hot-Carrier and Negative Bias Temperature Instability Effects on 65 nm Node
碩士 === 國立臺北科技大學 === 機電整合研究所 === 97 === Hot carrier (HC) effect has been the major reliability issue to study. In early researches, HC showed the worst degradation at DAHC mode low temperature. However, a recent study reported that the worst case has switched from DAHC to CHC mode and from low to hig...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/3zm7h3 |