Investigation of Near Field measurement in IC EMC

碩士 === 國立雲林科技大學 === 電機工程系碩士班 === 97 === In recent years, the rapidly developed fabrication technology has made most electronic products highly densely integrated. Under high-frequency or high-speed conditions, the closer the circuit components are in these products, the higher the chances the electr...

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Bibliographic Details
Main Authors: Jhen-Yu Wang, 王振宇
Other Authors: none
Format: Others
Language:zh-TW
Published: 2009
Online Access:http://ndltd.ncl.edu.tw/handle/52928103639849448029