An Artificial Neural Network Approach for Monitoring High-Yield Processes
碩士 === 元智大學 === 工業工程與管理學系 === 97 === Shewhart p chart is usually used to monitor the fraction nonconforming of a high-yield process. It has been shown to possess some practical difficulties, such as too many false alarms, meaningless control limits and failure in detecting process improvement when f...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/49791172414370496947 |