ESD Protection Circuit for High Gain Low Noise Amplifier Applications
碩士 === 長庚大學 === 電子工程學系 === 98 === The major cause of most damaged devices or systems is electrostatic discharge(ESD). This damage will impact the characteristics of IC circuits. The device reliability is one of the most important key point when we design the IC circuit. We expect to design ESD prote...
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| Format: | Others |
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2010
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| Online Access: | http://ndltd.ncl.edu.tw/handle/24359832594332861870 |