Finite Element Simulation and Analysis on Cantilever Probe Card structure

碩士 === 中華大學 === 機械工程學系碩士班 === 98 === The main purpose of this research is to investigate the cantilever probe card mechanics behavior. It takes sliding and contact force testing for the probe card before normal its operation. However, the testing is performed in a single probe and does not consi...

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Bibliographic Details
Main Authors: Hsueh, Ming-Tai, 薛明泰
Other Authors: Chen, Ching-I
Format: Others
Language:zh-TW
Published: 2010
Online Access:http://ndltd.ncl.edu.tw/handle/14561102458746305961