A Study of the Detection for LED with Machine Vision and Infrared Thermal Imaging technologies

碩士 === 華梵大學 === 機電工程學系博碩專班 === 98 === In this study, IR images are acquired with IR CCD camera, and the detection algorithm is proposed to detect the defect of LED. Detection items include the size, shape, and silver ring of chip which can be extracted using binary, moving noise, hole-filling, blob...

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Bibliographic Details
Main Authors: CHENG-JEN LEE, 李正仁
Other Authors: Kuo-Yi HuangKuo-Yi HuangKUO-YI HUANG
Format: Others
Language:zh-TW
Published: 2010
Online Access:http://ndltd.ncl.edu.tw/handle/21340213124002410372