| Summary: | 碩士 === 華梵大學 === 機電工程學系博碩專班 === 98 === In this study, IR images are acquired with IR CCD camera, and the detection algorithm is proposed to detect the defect of LED. Detection items include the size, shape, and silver ring of chip which can be extracted using binary, moving noise, hole-filling, blob analysis methods. The detecting software is developed to sort for LED samples. From the experiment results, the methodology presented herein effectively detected and classified LED in high accuracy. In the future, the developed methods can be used to detect the quality of LED online, to increase effective and reduce cost.
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