Yield Improvement of Current Sensing Chip Resistor by Laser Trimming
碩士 === 國立高雄應用科技大學 === 電子工程系 === 98 === In the manufacture of current sensing chip resistor, the process yield has been determined mainly on laser trimming. After laser trimming, the standard deviation of resistance and process yield will get worse for a smaller size and lower resistance device. In t...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2010
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| Online Access: | http://ndltd.ncl.edu.tw/handle/49558083810346273545 |