Automatic defect classification for TFT-LCD Cell process inspection using wavelet transform reconstruction and fuzzy support vector machine
碩士 === 明新科技大學 === 工業工程與管理研究所 === 99 === In cell process, some defects are critical to the quality of LCD panels, while some are not. This paper proposes a defect identification system by which the defects can be automatically identified and classified. The proposed system is composed of four parts:...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/90394490680589720977 |