Electrical Properties and Reliability Studies of P-Channel LTPS-TFT Devices
碩士 === 明新科技大學 === 光電科技產業研發碩士專班 === 99 === This paper presents the illumination reliability and DC bias stability of P-TFT devices doped with B2H6 and un-doped with B2H6. Photo reliability results indicate that the threshold voltage (Vth), of the p-TFT device was shifted to positive values by increas...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/77527355275359353509 |