Investigation of Nano-scale Copper ECMP Mechanism on Damascene Process for Semiconductor Integrated Circuits

博士 === 國立成功大學 === 材料科學及工程學系碩博士班 === 98 === This dissertation explores nano-scale copper (Cu) electrochemical mechanical planarization (ECMP) mechanism on damascene process for semiconductor integrated circuits. ECMP process has no abrasive particle because the broken circuits are formed by scratche...

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Bibliographic Details
Main Authors: Te-MingKung, 孔德明
Other Authors: Chuan-Pu Liu
Format: Others
Language:zh-TW
Published: 2010
Online Access:http://ndltd.ncl.edu.tw/handle/85430876509393968419