Study of traps in fullerene(C60) by Q-DLTS
碩士 === 國立成功大學 === 微電子工程研究所碩博士班 === 98 === In this thesis we used charge-based deep level transient spectroscopy (Q-DLTS) to measure traps in fullerene (C60), and measured the variation of traps under different treatments, for example: annealing, decay, and doping; furthermore, we expected the influe...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2010
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/93273517844785224635 |