Study of traps in fullerene(C60) by Q-DLTS
碩士 === 國立成功大學 === 微電子工程研究所碩博士班 === 98 === In this thesis we used charge-based deep level transient spectroscopy (Q-DLTS) to measure traps in fullerene (C60), and measured the variation of traps under different treatments, for example: annealing, decay, and doping; furthermore, we expected the influe...
Main Authors: | Chien-ChungChen, 陳建中 |
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Other Authors: | Wei-Chou Hsu |
Format: | Others |
Language: | en_US |
Published: |
2010
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Online Access: | http://ndltd.ncl.edu.tw/handle/93273517844785224635 |
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