Interface morphologic and electrical characteristic of bonded n-Si/n-GaAs

碩士 === 國立交通大學 === 材料科學與工程系所 === 98 === The integration of III–V optical devices and Silicon attract much interest for OEICs applications. Wafer bonding can provide high quality interface for combination of these materials. During high pressure and high temperature anneal, wafer bonded by producing c...

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Bibliographic Details
Main Authors: Chang, Tai-Min, 張岱民
Other Authors: Wu, Yew-Chung Sermon
Format: Others
Language:zh-TW
Published: 2009
Online Access:http://ndltd.ncl.edu.tw/handle/55810986502713481713