Reliability and Monte Carlo Analysis in Advanced CMOS and SONOS Flash Memory
博士 === 國立交通大學 === 電子工程系所 === 98 === This thesis will focus on the Monte Caro simulation and its applications to advanced CMOS and SONOS flash memory. The reliability issue, negative bias temperature instability (NBTI) in advanced gate dielectric (high-k), is studied as well. In Chapter 1, three app...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2010
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| Online Access: | http://ndltd.ncl.edu.tw/handle/26589269852202730502 |