Investigate the Effect of Ti Incorporation on NiO RRAM
碩士 === 國立交通大學 === 電子研究所 === 98 === Abstract For the coming of digital generation, nonvolatile memory (NVM) plays an important role in our life, especially for portable electronic products, such as the mobile phone, digital camera, and notebook etc. However, the problems of scaling limit for NVM are...
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| Format: | Others |
| Language: | en_US |
| Published: |
2010
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| Online Access: | http://ndltd.ncl.edu.tw/handle/06458419759954809393 |