In-plane Resonance Measurement of Cracked Photovoltaic Cell Substrates using Electronic Speckle Pattern Interferometry
碩士 === 國立交通大學 === 機械工程學系 === 98 === The trend of silicon-based photovoltaic cells is toward increasing wafer size and decreasing substrate thickness. However, silicon has high stiffness and low toughness. Micro-defects having tiny crack width are frequently generated in the brittle cell substrates d...
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| Format: | Others |
| Language: | zh-TW |
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2010
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| Online Access: | http://ndltd.ncl.edu.tw/handle/94282793770542106180 |