Investigation on stability analysis for novel thin-film-transistors with a transparent a-IGZO channel layer

碩士 === 國立交通大學 === 光電工程學系 === 98 === Amorphous oxide semiconductors (AOSs) are attracted much attention due to high mobility, low temperature deposition, flexible,transmission, and uniformity.It has been investigated of AOSs, such as ITO, IZO, TiO2, ZnO, In2O3, Ga2O3, IGO, a-IGZO,etc. Especially,the...

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Bibliographic Details
Main Authors: Li, Fu-Hai, 李富海
Other Authors: Liu, Po-Tsun
Format: Others
Language:en_US
Published: 2010
Online Access:http://ndltd.ncl.edu.tw/handle/21029337067288683098