Stabilization of Amorphous Indium-Gallium-Zinc Oxide Thin Film Transistors by a Passivation Layer

碩士 === 國立交通大學 === 顯示科技研究所 === 98 === The discovery of transparent oxides with high mobility realizes the transparent electronics and is being used for LCD backplane. The electrical instability of amorphous indium-gallium-zinc oxide (IGZO) thin film transistors is caused by two mechanisms:the interac...

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Bibliographic Details
Main Authors: Chen, Yung-Tsai, 陳泳材
Other Authors: Shieh, Han-Ping
Format: Others
Language:en_US
Published: 2010
Online Access:http://ndltd.ncl.edu.tw/handle/01754003013392098373