Reliability Analysis and Self-Heating Effect forAmorphous Silicon Thin Film Transistor
碩士 === 國立交通大學 === 平面顯示技術碩士學位學程 === 98 === In this paper, self-heating effect (SHE) on the transfer characteristic and the reliability of amorphous silicon thin film transistors (a-Si TFTs) are discussed. When the current-induced Joule heat can not be quickly dissipated, the increasing device tempera...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/75656745409036219701 |