Measure the junction temperature of alternating current light-emitting diodes.
碩士 === 國立中央大學 === 機械工程研究所 === 98 === There are several methods employed to measure junction temperature using Micro-Raman spectroscopy, electroluminescence, photoluminescence, noncontact method, and forward voltage method. The forward voltage method is most popularly used today because it is easy t...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2010
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| Online Access: | http://ndltd.ncl.edu.tw/handle/08228895585706802499 |