Research on optical monitor through optical admittance analysis and dynamic interferometry
博士 === 國立中央大學 === 光電科學研究所 === 98 === The optical monitoring method is generally thought better than other methods to manufacture optical filters, and for a costly optical filter manufacture, more precise optical monitor is necessary. In a growing thin film stack, the refractive indices of materials...
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| Format: | Others |
| Language: | en_US |
| Published: |
2010
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| Online Access: | http://ndltd.ncl.edu.tw/handle/49767591231608564418 |