Low-Cost Fast Distribution-Programmable Jitter Generator for Communication Test
碩士 === 國立彰化師範大學 === 電子工程學系 === 98 === To achieve high design reliability, jitter testing and measurement are becoming indispensable. However, as the chip density and system speed higher and higher, there are many challenges to use external equipment to generate distribution-programmable jitters for...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/27816211720186623968 |