Measurement method and discussion of thin (thick) film material thermal conductivity
碩士 === 國立清華大學 === 動力機械工程學系 === 98 === It is well known that material prosperities will be different as the material in micro and nano scale. For instance, the effect of interface boundary and the carriers such as phonon and free-electron scattering have become the primary issue in thin film material...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2010
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/64776734651402500266 |