SOC Test Architecture and Method for 3D ICs
博士 === 國立清華大學 === 電機工程學系 === 98 === Abstract By continuous technology scaling, the semiconductor industry has kept up with the Moore’s Law for decades to satisfy the endless demands in both functionality and performance of electronic devices. But until recently, they have to face the bottleneck of...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2010
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| Online Access: | http://ndltd.ncl.edu.tw/handle/82491458727179917528 |