Nano fabrication and measurement of phase-change thin film by ultrafast laser and atomic force microscopy

碩士 === 臺灣大學 === 物理研究所 === 98 === Phase change materials has different optical and electrical properties in crystalline and amorphous state, it has been applied to versatile areas such as optical data storage, phase change memory, nanolithography. In this paper, we present a laser-induced forward tra...

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Bibliographic Details
Main Authors: Ming-Lun Tseng, 曾銘綸
Other Authors: Din Ping Tsai
Format: Others
Language:zh-TW
Published: 2010
Online Access:http://ndltd.ncl.edu.tw/handle/82685684794523274472