Simulation Flow and Circuit Analysis of NBTI Effects on 3D Integrated Circuits
碩士 === 臺灣大學 === 電子工程學研究所 === 98 === With CMOS technology scaled into 65nm and 45nm node, the NBTI (negative bias temperature instability) effect has become a major reliability problem in modern circuit systems. In order to predict the threshold voltage shift and circuit performance degradation cau...
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2010
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| Online Access: | http://ndltd.ncl.edu.tw/handle/77356348719628362326 |