Scan Test Pattern Generation Considering Test Power, Compressibility, and IR-Drop Effects
博士 === 臺灣大學 === 電子工程學研究所 === 98 === Scan testing is a widely used test methodology in the industry and the automatic test pattern generation (ATPG) problem has been studied for several decades.Although ATPG is a classical problem, modern high operating frequency, low-power, and high complexity circu...
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| Format: | Others |
| Language: | en_US |
| Published: |
2010
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| Online Access: | http://ndltd.ncl.edu.tw/handle/69449390805370799779 |