Growth and characterization of ZnO nanowires by thermal oxidation of metallic zinc films

碩士 === 國立臺灣科技大學 === 電子工程系 === 98 === Metallic zinc films with various surface roughness were prepared by ion beam sputter deposition utilizing beam energy at 8, 12 and 16 keV and the zinc films were subject to thermal oxidation at 330 ~ 420 ℃. Experimental results show that thermal oxidation of met...

Full description

Bibliographic Details
Main Authors: Ching-fu Lin, 林勁甫
Other Authors: Liang -Chiun Chao
Format: Others
Language:zh-TW
Published: 2010
Online Access:http://ndltd.ncl.edu.tw/handle/98639713026729660851