Study on the transverse displacement measurement by uses of the critical angle method and a CCD
碩士 === 國立虎尾科技大學 === 光電與材料科技研究所 === 98 === Study on the transverse displacement measurement by uses of the critical angle method and a CCD, the technique based on the critical angle method and the use of the image system of CCD is presented. We used an objective with the NA value of 0.7 and the magni...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2010
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/88u9xv |