Integration of DFMEA and regression method in warpage forecast interface design of semiconductor IC product

碩士 === 樹德科技大學 === 應用設計研究所 === 98 === To fulfill the goals of high performance and density, semiconductor IC products are required to be as small and light as possible, which will diminish the firmness of the IC structure. Consequently, the possibility of warpage is increasing dramatically. This stud...

Full description

Bibliographic Details
Main Authors: Yi-Hsin Chuang, 莊益信
Other Authors: Ho-Chin Chen
Format: Others
Language:zh-TW
Published: 2010
Online Access:http://ndltd.ncl.edu.tw/handle/42884838726925133522